Articles | Volume 9
https://doi.org/10.5194/ars-9-9-2011
https://doi.org/10.5194/ars-9-9-2011
29 Jul 2011
 | 29 Jul 2011

Verification of scattering parameter measurements in waveguides up to 325 GHz including highly-reflective devices

T. Schrader, K. Kuhlmann, R. Dickhoff, J. Dittmer, and M. Hiebel

Viewed

Total article views: 3,260 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
860 2,049 351 3,260 123 115
  • HTML: 860
  • PDF: 2,049
  • XML: 351
  • Total: 3,260
  • BibTeX: 123
  • EndNote: 115
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads (calculated since 01 Feb 2013)

Cited

Latest update: 26 Apr 2024