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Volume 9
ARS, 9, 303–308, 2011
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https://doi.org/10.5194/ars-9-303-2011
© Author(s) 2011. This work is distributed under
the Creative Commons Attribution 3.0 License.
https://doi.org/10.5194/ars-9-303-2011
© Author(s) 2011. This work is distributed under
the Creative Commons Attribution 3.0 License.
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01 Aug 2011
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01 Aug 2011
Coupling path influence on the conducted emission measurement results by the EMC semiconductor test board
M. Frick
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M. Frick
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Engineering Electromagnetic Compatibility, Robert Bosch GmbH, Reutlingen, Germany
R. Eidher
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Engineering Electromagnetic Compatibility, Robert Bosch GmbH, Reutlingen, Germany
R. Weigel
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Institute for Electronics Engineering, Friedrich-Alexander-University of Erlangen-Nuremberg, Germany
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