Advances in Radio Science
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Volume 7, 2009
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Volume 7
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Volume 7, 2009 | D.2 Digital circuits I
Volume 7
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Volume 7
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Volume 7, 2009 | D.2 Digital circuits I
19 May 2009
Impact of negative and positive bias temperature stress on 6T-SRAM cells
S. Drapatz, G. Georgakos, and D. Schmitt-Landsiedel
Adv. Radio Sci., 7, 191–196,
https://doi.org/10.5194/ars-7-191-2009,
https://doi.org/10.5194/ars-7-191-2009,
2009
CC BY 4.0
