TY - JOUR A1 - Schlünder, C. T1 - Device reliability challenges for modern semiconductor circuit design – a review JO - Adv. Radio Sci. J1 - ARS VL - 7 SP - 201 EP - 211 Y1 - 2009/05/19 PB - Copernicus Publications SN - 1684-9973 UR - https://ars.copernicus.org/articles/7/201/2009/ L1 - https://ars.copernicus.org/articles/7/201/2009/ars-7-201-2009.pdf DO - 10.5194/ars-7-201-2009 ER -