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Advances in Radio Science An open-access journal of the U.R.S.I. Landesausschuss in der Bundesrepublik Deutschland e.V.
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Volume 5
Adv. Radio Sci., 5, 439-445, 2007
https://doi.org/10.5194/ars-5-439-2007
© Author(s) 2007. This work is licensed under
the Creative Commons Attribution-NonCommercial-ShareAlike 2.5 License.
Adv. Radio Sci., 5, 439-445, 2007
https://doi.org/10.5194/ars-5-439-2007
© Author(s) 2007. This work is licensed under
the Creative Commons Attribution-NonCommercial-ShareAlike 2.5 License.

  13 Jun 2007

13 Jun 2007

Methods for the calibrated measurement of the scattering parameters of planar multi-port devices

I. Rolfes1 and B. Schiek2 I. Rolfes and B. Schiek
  • 1Institut für Hochfrequenztechnik und Funksysteme, Universität Hannover, Appelstraße 9A, 30167 Hannover, Germany
  • 2Institut für Hochfrequenztechnik, Ruhr-Universität Bochum, Universitätsstraße 150, 44801 Bochum, Germany

Abstract. In this article, the error-corrected determination of complex scattering parameters of multi-port devices by means of a 2-port vector network analyzer is presented. As only two ports of the device under test can be connected to the analyzer ports at a time, the remaining device ports have to be terminated by external reflections. In order to measure the scattering parameters of the DUT without the influence of systematic errors and of the external terminations, an error correction has to be performed besides the calibration. For this purpose, the application of the multi-port procedure is presented. This method has the advantage, that the external reflective terminations can be chosen arbitrarily. Furthermore, these terminations can be unknown except for one. An automatized measurement system based on a switching network is shown, which is optimized for the measurement of planar microwave circuits. An error model for the description of the measurement setup as well as a calibration procedure for the elimination of the systematic errors are presented.

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