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Advances in Radio Science An open-access journal of the U.R.S.I. Landesausschuss in der Bundesrepublik Deutschland e.V.
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Volume 5
Adv. Radio Sci., 5, 427–434, 2007
https://doi.org/10.5194/ars-5-427-2007
© Author(s) 2007. This work is licensed under
the Creative Commons Attribution-NonCommercial-ShareAlike 2.5 License.
Adv. Radio Sci., 5, 427–434, 2007
https://doi.org/10.5194/ars-5-427-2007
© Author(s) 2007. This work is licensed under
the Creative Commons Attribution-NonCommercial-ShareAlike 2.5 License.

  13 Jun 2007

13 Jun 2007

Contactless electromagnetic measuring system using conventional calibration algorithms to determine scattering parameters

T. Zelder, H. Rabe, and H. Eul T. Zelder et al.
  • Institut für Hochfrequenztechnik und Funksysteme, Universität Hannover, Appelstraße 9A, 30167 Hannover, Germany

Abstract. In this paper, a contactless measuring system for the determination of the S-parameters of planar circuits is presented. With a contactless measuring system it is possible to characterise a device-under-test (DUT) embedded in a planar circuit environment without cutting the planar transmission lines connecting the DUT. The technique utilizes four identical capacitive probes in conjunction with a vector network analyser (VNA). For the usage of electromagnetic probes compared to other coupling techniques like the electro-optic probing, there is no need for expensive and complex equipment in addition to the typical equipment of a common microwave laboratory. The S-parameters are determined accurately using conventional calibration methods. A simple analytical model for the representation of the basic characteristics is developed. Furthermore, the influences on the S-parameters as a result of a variation in the coupling are presented. With the knowledge of the system characteristics, an accurate contactless measurement system is set up. The comparison between conventional and contactless measurements in a frequency range of 1–20 GHz shows a very good agreement with a phase error smaller than 1°.

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