Articles | Volume 1
https://doi.org/10.5194/ars-1-155-2003
https://doi.org/10.5194/ars-1-155-2003
05 May 2003
05 May 2003

Spectral Signature Analysis – BIST for RF Front-Ends

D. Lupea, U. Pursche, and H.-J. Jentschel

Abstract. In this paper, the Spectral Signature Analysis is presented as a concept for an integrable self-test system (Built-In Self-Test – BIST) for RF front-ends is presented. It is based on modelling the whole RF front-end (transmitter and receiver) on system level, on generating of a Spectral Signature and of evaluating of the Signature Response. Because of using multi-carrier signal as the test signature, the concept is especially useful for tests of linearity and frequency response of front-ends. Due to the presented method of signature response evaluation, this concept can be used for Built-In Self-Correction (BISC) at critical building blocks.