| Volumes Volume 7 |
ARS - Volume 7, 2009
D.3 Technology-oriented circuits I| An experimental study on passive charge balancing Page(s) 197-200 Abstract Full Article in PDF (PDF, 485 KB) | ||
| Device reliability challenges for modern semiconductor circuit design – a review Page(s) 201-211 Abstract Full Article in PDF (PDF, 5842 KB) |
