Volumes  Volume 7  

ARS - Volume 7, 2009

D.2 Digital circuits I

Impact of negative and positive bias temperature stress on 6T-SRAM cells
S. Drapatz, G. Georgakos, and D. Schmitt-Landsiedel
Page(s) 191-196
Abstract   Full Article in PDF (PDF, 257 KB)


  19 May 2009
 

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