Advances in Radio Science
An Open Access Journal of the U.R.S.I. Landesausschuss in der Bundesrepublik Deutschland e.V.
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Volume 7
ARS - Volume 7, 2009
D.2 Digital circuits I
Impact of negative and positive bias temperature stress on 6T-SRAM cells
S. Drapatz, G. Georgakos, and D. Schmitt-Landsiedel
Page(s) 191-196
Abstract
Full Article in PDF
(PDF, 257 KB)
19 May 2009
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