| Volumes Volume 6 |
ARS - Volume 6, 2008
D.3 Scaling of MOSFET and integrated HF-circuits| Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system Page(s) 205-207 Abstract Full Article in PDF (PDF, 3010 KB) | ||
| Investigation of carbon nanotube antennas using thin wire integral equations Page(s) 209-211 Abstract Full Article in PDF (PDF, 259 KB) | ||
| A low-noise current preamplifier in 120 nm CMOS technology Page(s) 213-217 Abstract Full Article in PDF (PDF, 2535 KB) | ||
| Highly efficient integrated rectifier and voltage boosting circuits for energy harvesting applications Page(s) 219-225 Abstract Full Article in PDF (PDF, 4375 KB) |
