@Article{ars-6-205-2008,
AUTHOR = {Domdey, A. and Hafkemeyer, K. M. and Krautschneider, W. H. and Schroeder, D.},
TITLE = {Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system},
JOURNAL = {Advances in Radio Science},
VOLUME = {6},
YEAR = {2008},
PAGES = {205--207},
URL = {http://www.adv-radio-sci.net/6/205/2008/},
DOI = {10.5194/ars-6-205-2008}
}