Advances in Radio Science www.adv-radio-sci.net 1684-9965 1684-9973 6 Kleinheubacher Berichte 2007 2008 10.5194/ars-6-19-2008 http://www.adv-radio-sci.net/6/19/2008/ http://www.adv-radio-sci.net/6/19/2008/ars-6-19-2008.html http://www.adv-radio-sci.net/6/19/2008/ars-6-19-2008.pdf 19 25 2008-05-26 Usage of the contactless vector network analysis with varying transmission line geometries T. Zelder B. Geck I. Rolfes H. Eul Institut für Hochfrequenztechnik und Funksysteme, Leibniz Universität Hannover, Appelstr. 9A, 30167 Hannover, Germany The scattering parameters of embedded devices can be measured by means of contactless vector network analysis. To achieve accurate measurement results, the contactless measurement setup has to be calibrated. However, if the substrate material or the planar transmission lines on the substrate changes, a new calibration is necessary. In this paper a method will be examined, which reduces the number of calibration cycles by using a database. Analytical results show that by using this database method, errors occur which depend on the coupling coefficients and on the load impedances of the contactless probes. However, the measurement results show deviations smaller than 7% in comparison to the conventional vector network analysis, which is sufficient for the most pratical applications. Dudley, R., Roddie, A., Bannister, D., Gifford, A., Krems, T., and Facon, P.: Electro-optic S-parameter and electric-field profiling measurement of microwave integrated circuits, IEE Proceedings – Science, Measurement and Technology, 146, 117–122, 1999. Engen, G. and Hoer, C.: Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer, IEEE Transactions on Microwave Theory and Techniques, 27, 987–993, 1979. Rehnmark, S.: On the calibration process of automatic network analyzer systems, IEEE Transactions on Microwave Theory and Techniques, 22, 457–458, 1974. Sayil, S., Kerns, D. V. J., and Kerns, S.: Comparison of contactless measurement and testing techniques to a all-silicon optical test and characterization method, IEEE Transactions on Instrumentation and Measurement, 54, 2082–2089, 2005. Stenarson, J., Yhland, K., and Wingqvist, C.: An in-circuit noncontacting measurement method for S-parameters and power in planar circuits, IEEE Transactions on Microwave Theory and Techniques, 49, 2567–2572, 2001. Yhland, K. and Stenarson, J.: Noncontacting measurement of power in microstrip circuits, 65th ARFTG Conference Digest, 201–205, 2005. Zelder, T. and Eul, H.: Contactless network analysis with improved dynamic range using diversity calibration, Proceedings of the 36th European Microwave Conference, 478–481, 2006. Zelder, T., Geck, B., Wollitzer, M., Rolfes, I., and Eul, H.: Contactless Network Analysis System for the Calibrated Measurement of the Scattering Parameters of Planar Two-Port Devices, Proceedings of the 37th European Microwave Conference, 246–249, 2007a. Zelder, T., Rabe, H., and Eul, H.: Contactless electromagnetic measuring system using conventional calibration algorithms to determine scattering parameters, Adv. Radio Sci., 5, 427–434, 2007b.