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<article language="en">
	<journal>
		<journal_title>Advances in Radio Science</journal_title>
		<journal_url>www.adv-radio-sci.net</journal_url>
		<issn>1684-9965</issn>
		<eissn>1684-9973</eissn>
		<volume_number>5</volume_number>
		<volume_title>Kleinheubacher Berichte 2006</volume_title>
		<publication_year>2007</publication_year>
	</journal>
	<doi>10.5194/ars-5-13-2007</doi>
	<article_url>http://www.adv-radio-sci.net/5/13/2007/</article_url>
	<abstract_html>http://www.adv-radio-sci.net/5/13/2007/ars-5-13-2007.html</abstract_html>
	<fulltext_pdf>http://www.adv-radio-sci.net/5/13/2007/ars-5-13-2007.pdf</fulltext_pdf>
	<start_page>13</start_page>
	<end_page>17</end_page>
	<publication_date>2007-06-12</publication_date>
	<article_title content_type="html">Novel algorithms for the characterization of n-port networks by using a two-port network analyzer</article_title>
	<authors>
		<author numeration="1" affiliations="1">
			<name>B. Will</name>
			<email>bianca.will@rub.de</email>
		</author>
		<author numeration="2" affiliations="2">
			<name>I. Rolfes</name>
		</author>
		<author numeration="3" affiliations="1">
			<name>B. Schiek</name>
		</author>
	</authors>
	<affiliations>
		<affiliation numeration="1" content_type="html">Ruhr-Universität Bochum, Institut für  Hochfrequenztechnik, Universitätsstrasse 150, 44801 Bochum,  Germany</affiliation>
		<affiliation numeration="2" content_type="html">Leibniz-Universität Hannover, Institut für Hochfrequenztechnik und Funksysteme, Appelstrasse 9A, 30167  Hannover, Germany</affiliation>
	</affiliations>
	<abstract content_type="html">The measurement of the scattering matrices of n-port networks is
an important task. For this purpose two ports of the n-port network
are connected with the network analyzer and the remaining ports are
connected to reflecting terminations. In order to specify the
scattering matrix of a n-port network with the multi-port method
(Rolfes et al., 2005), &lt;i&gt;n&lt;/i&gt; reflecting terminations are required
from which at least one reflection factor needs to be known.

&lt;br&gt;&lt;br&gt;
There are some cases, in which the multi-port method shows weak
convergence properties. For example, a T-junction cannot be
identified if the reflecting terminations used are short circuits
and if the line length is equivalent to a multiple of a half
wavelength. This is due to the fact that the two ports connected to
the
network analyzer become isolated.

&lt;br&gt;&lt;br&gt;
Two new algorithms, named the sub-determinant method and the
wave-identification method, respectively, which employ a second set
of reflection terminations that have to differ from the first set,
allow to identify every n-port network without the necessity to
distinguish different cases. Both methods are based on least square
algorithms and allow to determine all scattering parameters of a
n-port-network directly and uniquely.</abstract>
	<references>
		<reference numeration="1" content_type="text"> Bauer, R F. and Penfield, P.: De-Embedding and Unterminating, in: IEEE Trans. Microw. Theory Tech., vol. 22, pp. 282&amp;ndash;288, March, 1974. </reference>
		<reference numeration="2" content_type="text"> Engen, G F. and Hoer, C A.: Thru-Reflect-Line: An improved technique for calibrating the dual six port automatic network analyzer, in: IEEE Trans. Microw. Theory Tech., vol. 27, pp. 987&amp;ndash;993, December, 1979. </reference>
		<reference numeration="3" content_type="text"> Eul, H.-J. and Schiek, B.: A Generalized Theory and New Calibration Procedures for Network Analyzer Self-Calibration, in: IEEE Trans. Microw. Theory Tech., vol. 39, pp. 724&amp;ndash;731, April, 1991. </reference>
		<reference numeration="4" content_type="text"> Lu, H.-C. and Chu, T.-H.: Multiport Scattering Matrix Measurement Using a Reduced-Port Network Analyzer, in: IEEE Trans. Microw. Theory Tech., vol. MTT-51, pp. 1525&amp;ndash;1533, May, 2003. </reference>
		<reference numeration="5" content_type="text"> Rolfes, I. and Schiek, B.: Multiport Method for the Measurement of the Scattering Parameters of N-Ports, in: IEEE Trans. Microw. Theory Tech., vol. 53, pp. 1990&amp;ndash;1996, June, 2005. </reference>
		<reference numeration="6" content_type="text"> Tippet, J C. and Speciale, R A.: A Rigorous Technique for Measuring the Scattering Matrix of a Multiport Device with a 2-Port Network Analyzer, in: IEEE Trans. Microw. Theory Tech., vol. MTT-30, pp. 661&amp;ndash;666, May, 1982.  </reference>
	</references>
</article>

