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Advances in Radio Science An open-access journal of the U.R.S.I. Landesausschuss in der Bundesrepublik Deutschland e.V.

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Adv. Radio Sci., 11, 177-182, 2013
http://www.adv-radio-sci.net/11/177/2013/
doi:10.5194/ars-11-177-2013
© Author(s) 2013. This work is distributed
under the Creative Commons Attribution 3.0 License.
 
04 Jul 2013
Reproducing system-level bulk current injection test in direct power injection setup for multiple-port DUTs
S. Miropolsky and S. Frei TU Dortmund, Dortmund, Germany
Abstract. Many investigations have been published on the transferability of RF immunity test results between system and IC-levels. The RF signal level at DUT (Device under Test) inputs, i.e. either RF voltage amplitude or RF input current, is used as a reference value for the load on the DUT. Existing approaches analyze the DUT response as a function of the RF signal level at a single input pin, e.g. supply voltage. Sufficient accuracy of such an approach could be shown in several cases, but results are not sufficient as a general solution for complex DUT. This paper proposes both theoretical analysis and practical implementation of a DPI setup, where a disturbance, equivalent to system-level BCI setup, can be delivered to multiple DUT input ports.

Citation: Miropolsky, S. and Frei, S.: Reproducing system-level bulk current injection test in direct power injection setup for multiple-port DUTs, Adv. Radio Sci., 11, 177-182, doi:10.5194/ars-11-177-2013, 2013.
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