TY  - JOUR
A1  - Li, H.
A1  - Eckmueller, J.
A1  - Sattler, S.
A1  - Eichfeld, H.
A1  - Weigel, R.
T1  - A new BIST scheme for low-power and high-resolution DAC testing
JO  - Adv. Radio Sci.
J1  - ARS
VL  - 1
SP  - 289
EP  - 293
Y1  - 2003/05/05
PB  - Copernicus Publications
SN  - 1684-9965
UR  - http://www.adv-radio-sci.net/1/289/2003/
L1  - http://www.adv-radio-sci.net/1/289/2003/ars-1-289-2003.pdf
ER  -